Terahertz Far-Infrared Spectroscopy III. Ultrafast Spectroscopy
نویسندگان
چکیده
منابع مشابه
Far Infrared Studies of Silicon using Terahertz Spectroscopy
In this work, the optical properties of ptype silicon wafers, of various thicknesses, have been studied in the frequency range of 0.2 – 1.2 THz. It is seen that, for low resistivity silicon, the optical properties are dominated by the presence of dopants. The analysis technique deployed in the present work explores a general iterative procedure to determine the real and imaginary parts of the c...
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ژورنال
عنوان ژورنال: Journal of the Spectroscopical Society of Japan
سال: 2005
ISSN: 1884-6785,0038-7002
DOI: 10.5111/bunkou.54.181